TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_50_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-021-06 | FUSED_ID : 6359364768400179542
  IC_TEMP :  -52.48 | VDDM : 1125.94 | AUX_INT :   -5.15 | CsaBias :   75.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.70904e-04 / 2
  ADC_P0  : -5.14897e-03 ± 1.87870e-02
  ADC_P1  : 8.06893e-03 ± 4.50694e-04
  ADC_P2  : -5.24604e-06 ± 2.13286e-06
  CSA_Chi2/NDF : 1.10936e-04 / 2
  CSA_P0  : 5.79533e-02 ± 7.02520e-03
  CSA_P1  : 9.95431e-03 ± 5.29298e-04
  CSA_P2  : -4.62997e-05 ± 8.06059e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4158', '1.800', '0.1762', '1.800', '0.0969', '7.000', '0.7081', 1, 1, 1, 1, 1726221034.2770417]
VI_after__Init : ['1.202', '0.4156', '1.800', '0.1763', '1.800', '0.0911', '6.999', '0.7080', 1, 1, 1, 1, 1726221042.3784802]
VI_at__the_End : ['1.202', '0.4964', '1.800', '0.1382', '1.800', '0.1125', '7.000', '0.7085', 1, 1, 1, 1, 1726221102.6737638]