TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_34_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-009-007-12 | FUSED_ID : 6359364768400183420
  IC_TEMP :  -53.45 | VDDM : 1130.47 | AUX_INT :   -7.32 | CsaBias :   89.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36696e-03 / 2
  ADC_P0  : -7.31621e-03 ± 2.50896e-02
  ADC_P1  : 8.09300e-03 ± 6.00873e-04
  ADC_P2  : -5.12493e-06 ± 2.85465e-06
  CSA_Chi2/NDF : 1.09583e-04 / 2
  CSA_P0  : 5.96405e-02 ± 6.98222e-03
  CSA_P1  : 9.57055e-03 ± 5.26060e-04
  CSA_P2  : -4.06488e-05 ± 8.01127e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [22, 25, 27, 32, 79, 88, 106, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [8, 15, 85, 88]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1890', '1.800', '0.1697', '1.800', '0.0821', '7.000', '0.7078', 1, 1, 1, 1, 1726223659.0651357]
VI_after__Init : ['1.202', '0.1890', '1.800', '0.1697', '1.800', '0.0764', '7.000', '0.7076', 1, 1, 1, 1, 1726223667.9354713]
VI_at__the_End : ['1.202', '0.4977', '1.800', '0.1402', '1.800', '0.1109', '7.000', '0.7083', 1, 1, 1, 1, 1726223726.6861482]