TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_29_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-009-010-12 | FUSED_ID : 6359364768400183468
  IC_TEMP :  -49.99 | VDDM : 1132.08 | AUX_INT :   -3.95 | CsaBias :   78.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.09691e-04 / 2
  ADC_P0  : -3.95429e-03 ± 1.67057e-02
  ADC_P1  : 8.27539e-03 ± 4.16136e-04
  ADC_P2  : -5.27306e-06 ± 2.04002e-06
  CSA_Chi2/NDF : 1.06974e-04 / 2
  CSA_P0  : 6.00408e-02 ± 6.89859e-03
  CSA_P1  : 9.89981e-03 ± 5.19759e-04
  CSA_P2  : -4.47470e-05 ± 7.91532e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [37, 47, 96, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [34, 54, 63, 64, 93, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3759', '1.800', '0.1720', '1.800', '0.0905', '7.000', '0.7081', 1, 1, 1, 1, 1726223367.0344603]
VI_after__Init : ['1.202', '0.3760', '1.800', '0.1720', '1.800', '0.0848', '7.000', '0.7077', 1, 1, 1, 1, 1726223375.084798]
VI_at__the_End : ['1.202', '0.5025', '1.800', '0.1419', '1.800', '0.1125', '7.002', '0.7086', 1, 1, 1, 1, 1726223442.0399103]