TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_26_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-009-012-12 | FUSED_ID : 6359364768400183500
  IC_TEMP :  -51.99 | VDDM : 1130.76 | AUX_INT :   -8.63 | CsaBias :   74.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26636e-03 / 2
  ADC_P0  : -8.62972e-03 ± 2.41199e-02
  ADC_P1  : 8.39291e-03 ± 5.95219e-04
  ADC_P2  : -5.61124e-06 ± 2.91895e-06
  CSA_Chi2/NDF : 1.33659e-04 / 2
  CSA_P0  : 6.02601e-02 ± 7.71119e-03
  CSA_P1  : 1.02820e-02 ± 5.80982e-04
  CSA_P2  : -5.05809e-05 ± 8.84768e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [2, 14, 37, 40, 101, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [27, 28, 50, 67, 74, 82, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3054', '1.800', '0.1312', '1.800', '0.0934', '7.000', '0.7077', 1, 1, 1, 1, 1726223172.7493396]
VI_after__Init : ['1.201', '0.3054', '1.800', '0.1312', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1726223181.4445794]
VI_at__the_End : ['1.202', '0.5025', '1.800', '0.1414', '1.800', '0.1124', '6.999', '0.7084', 1, 1, 1, 1, 1726223241.0841157]