TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_18_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-009-017-11 | FUSED_ID : 6359364768400183579
  IC_TEMP :  -53.33 | VDDM : 1128.50 | AUX_INT :   -4.76 | CsaBias :   71.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.66575e-04 / 2
  ADC_P0  : -4.75929e-03 ± 1.87592e-02
  ADC_P1  : 8.48717e-03 ± 4.80573e-04
  ADC_P2  : -5.29202e-06 ± 2.43030e-06
  CSA_Chi2/NDF : 1.51750e-04 / 2
  CSA_P0  : 6.02003e-02 ± 8.21649e-03
  CSA_P1  : 1.02371e-02 ± 6.19053e-04
  CSA_P2  : -5.04691e-05 ± 9.42745e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [12, 30, 52, 56, 93, 98, 107, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [8, 17, 19, 52, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4717', '1.800', '0.1493', '1.800', '0.0975', '7.000', '0.7083', 1, 1, 1, 1, 1726222688.011057]
VI_after__Init : ['1.202', '0.4722', '1.800', '0.1494', '1.800', '0.0903', '7.000', '0.7072', 1, 1, 1, 1, 1726222696.0624635]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1420', '1.800', '0.1126', '7.000', '0.7082', 1, 1, 1, 1, 1726222759.2487836]