TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_14_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-009-019-11 | FUSED_ID : 6359364768400183611
  IC_TEMP :  -57.83 | VDDM : 1126.28 | AUX_INT :   -9.00 | CsaBias :   68.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53346e-03 / 2
  ADC_P0  : -8.99675e-03 ± 2.65638e-02
  ADC_P1  : 8.64777e-03 ± 6.69539e-04
  ADC_P2  : -6.29113e-06 ± 3.34824e-06
  CSA_Chi2/NDF : 1.53316e-04 / 2
  CSA_P0  : 6.15597e-02 ± 8.25879e-03
  CSA_P1  : 1.00943e-02 ± 6.22241e-04
  CSA_P2  : -4.91723e-05 ± 9.47599e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [10, 68, 70, 87, 93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 42, 95, 109, 121, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2169', '1.800', '0.1448', '1.800', '0.0892', '7.000', '0.7081', 1, 1, 1, 1, 1726222492.1128812]
VI_after__Init : ['1.201', '0.2169', '1.800', '0.1449', '1.800', '0.0818', '7.000', '0.7072', 1, 1, 1, 1, 1726222500.950164]
VI_at__the_End : ['1.198', '0.4981', '1.800', '0.1432', '1.803', '0.1145', '7.000', '0.7081', 1, 1, 1, 1, 1726222560.9865978]