TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_11_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-009-021-11 | FUSED_ID : 6359364768400183643
  IC_TEMP :  -57.72 | VDDM : 1123.91 | AUX_INT :   -7.43 | CsaBias :   61.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.95910e-04 / 2
  ADC_P0  : -7.43396e-03 ± 2.02323e-02
  ADC_P1  : 8.65501e-03 ± 5.09691e-04
  ADC_P2  : -6.52245e-06 ± 2.54089e-06
  CSA_Chi2/NDF : 1.26977e-04 / 2
  CSA_P0  : 6.12860e-02 ± 7.51597e-03
  CSA_P1  : 1.03251e-02 ± 5.66274e-04
  CSA_P2  : -5.17048e-05 ± 8.62368e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [70, 106, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [15, 33, 40, 58, 69, 82, 83, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3909', '1.800', '0.1575', '1.800', '0.0945', '7.000', '0.7072', 1, 1, 1, 1, 1726222297.438435]
VI_after__Init : ['1.202', '0.3914', '1.800', '0.1568', '1.800', '0.0891', '7.004', '0.7072', 1, 1, 1, 1, 1726222306.2707992]
VI_at__the_End : ['1.202', '0.5035', '1.800', '0.1408', '1.800', '0.1153', '7.000', '0.7081', 1, 1, 1, 1, 1726222366.90116]