TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_08_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-009-023-11 | FUSED_ID : 6359364768400183675
  IC_TEMP :  -54.29 | VDDM : 1126.88 | AUX_INT :   -7.16 | CsaBias :   84.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36771e-03 / 2
  ADC_P0  : -7.16255e-03 ± 2.51232e-02
  ADC_P1  : 8.36204e-03 ± 6.28946e-04
  ADC_P2  : -5.04043e-06 ± 3.12825e-06
  CSA_Chi2/NDF : 1.75183e-04 / 2
  CSA_P0  : 5.88560e-02 ± 8.82811e-03
  CSA_P1  : 1.02004e-02 ± 6.65134e-04
  CSA_P2  : -5.01969e-05 ± 1.01292e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [16, 24, 46, 79, 103, 112, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [15, 40, 46, 53, 79, 88]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2516', '1.800', '0.1841', '1.800', '0.0912', '7.000', '0.7079', 1, 1, 1, 1, 1726222104.0566432]
VI_after__Init : ['1.202', '0.2516', '1.800', '0.1841', '1.800', '0.0840', '7.000', '0.7070', 1, 1, 1, 1, 1726222112.2211363]
VI_at__the_End : ['1.202', '0.5005', '1.800', '0.1396', '1.802', '0.1132', '6.999', '0.7081', 1, 1, 1, 1, 1726222177.493329]