TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_14_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-010-021-05 | FUSED_ID : 6359364768400187733
  IC_TEMP :  -59.41 | VDDM : 1133.90 | AUX_INT :   -7.65 | CsaBias :   75.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03836e-03 / 2
  ADC_P0  : -7.65122e-03 ± 2.18176e-02
  ADC_P1  : 8.32882e-03 ± 5.34823e-04
  ADC_P2  : -5.67125e-06 ± 2.59601e-06
  CSA_Chi2/NDF : 1.52633e-04 / 2
  CSA_P0  : 6.05639e-02 ± 8.24036e-03
  CSA_P1  : 1.00857e-02 ± 6.20852e-04
  CSA_P2  : -4.95367e-05 ± 9.45483e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 26, 28, 82, 100, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [28, 45, 72, 101, 115, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4602', '1.800', '0.1196', '1.800', '0.0959', '7.000', '0.7079', 1, 1, 1, 1, 1726226085.2503407]
VI_after__Init : ['1.202', '0.4605', '1.800', '0.1199', '1.800', '0.0905', '7.000', '0.7079', 1, 1, 1, 1, 1726226093.2527897]
VI_at__the_End : ['1.202', '0.4950', '1.800', '0.1400', '1.800', '0.1154', '7.000', '0.7087', 1, 1, 1, 1, 1726226160.2221348]