TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_58_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-007-15 | FUSED_ID : 6359364768400191615
  IC_TEMP :  -57.57 | VDDM : 1121.79 | AUX_INT :  -18.36 | CsaBias :   58.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90781e-03 / 2
  ADC_P0  : -1.83603e-02 ± 3.01697e-02
  ADC_P1  : 8.60458e-03 ± 7.39173e-04
  ADC_P2  : -6.39291e-06 ± 3.60744e-06
  CSA_Chi2/NDF : 1.42325e-04 / 2
  CSA_P0  : 5.90082e-02 ± 7.95725e-03
  CSA_P1  : 9.98634e-03 ± 5.99521e-04
  CSA_P2  : -4.85859e-05 ± 9.13000e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [30, 71, 97, 100, 106, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [43, 65, 86, 105, 108, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1887', '1.800', '0.1556', '1.800', '0.0842', '7.000', '0.7081', 1, 1, 1, 1, 1726228716.549279]
VI_after__Init : ['1.202', '0.1888', '1.800', '0.1555', '1.800', '0.0784', '7.000', '0.7081', 1, 1, 1, 1, 1726228724.687704]
VI_at__the_End : ['1.202', '0.4918', '1.800', '0.1373', '1.802', '0.1142', '7.000', '0.7087', 1, 1, 1, 1, 1726228787.378842]