TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_53_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-010-15 | FUSED_ID : 6359364768400191663
  IC_TEMP :  -52.52 | VDDM : 1129.73 | AUX_INT :   -7.99 | CsaBias :   82.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68277e-03 / 2
  ADC_P0  : -7.98992e-03 ± 2.78685e-02
  ADC_P1  : 8.31031e-03 ± 6.83450e-04
  ADC_P2  : -5.42981e-06 ± 3.32754e-06
  CSA_Chi2/NDF : 1.04481e-04 / 2
  CSA_P0  : 6.08462e-02 ± 6.81775e-03
  CSA_P1  : 9.64761e-03 ± 5.13669e-04
  CSA_P2  : -4.37311e-05 ± 7.82256e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [42, 71, 102, 105, 114, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [15, 80, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1169', '1.800', '0.1412', '1.800', '0.0821', '7.000', '0.7086', 1, 1, 1, 1, 1726228423.1656713]
VI_after__Init : ['1.202', '0.1169', '1.800', '0.1411', '1.800', '0.0747', '7.000', '0.7079', 1, 1, 1, 1, 1726228431.9790256]
VI_at__the_End : ['1.202', '0.4927', '1.800', '0.1405', '1.799', '0.1125', '7.004', '0.7089', 1, 1, 1, 1, 1726228493.2013128]