TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_42_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-017-08 | FUSED_ID : 6359364768400191768
  IC_TEMP :  -52.61 | VDDM : 1130.45 | AUX_INT :   -6.67 | CsaBias :   83.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.45152e-04 / 2
  ADC_P0  : -6.67230e-03 ± 1.96624e-02
  ADC_P1  : 8.26540e-03 ± 4.78813e-04
  ADC_P2  : -5.72385e-06 ± 2.30068e-06
  CSA_Chi2/NDF : 1.14207e-04 / 2
  CSA_P0  : 6.04141e-02 ± 7.12802e-03
  CSA_P1  : 9.93956e-03 ± 5.37045e-04
  CSA_P2  : -4.64267e-05 ± 8.17856e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 19, 39, 75, 108, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [7, 24, 67, 79, 89, 116, 122, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.5064', '1.800', '0.1417', '1.800', '0.0981', '6.999', '0.7078', 1, 1, 1, 1, 1726227741.0248075]
VI_after__Init : ['1.202', '0.5071', '1.800', '0.1420', '1.800', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1726227749.8260398]
VI_at__the_End : ['1.202', '0.5010', '1.800', '0.1390', '1.800', '0.1110', '7.000', '0.7087', 1, 1, 1, 1, 1726227816.9879506]