TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_18_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-007-07 | FUSED_ID : 6359364768400195703
  IC_TEMP :  -48.19 | VDDM : 1122.58 | AUX_INT :   -6.90 | CsaBias :   93.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07256e-03 / 2
  ADC_P0  : -6.89939e-03 ± 2.21994e-02
  ADC_P1  : 7.74377e-03 ± 5.11055e-04
  ADC_P2  : -4.52395e-06 ± 2.33811e-06
  CSA_Chi2/NDF : 7.97297e-05 / 2
  CSA_P0  : 5.89046e-02 ± 5.95569e-03
  CSA_P1  : 9.35209e-03 ± 4.48719e-04
  CSA_P2  : -3.66748e-05 ± 6.83345e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [15, 31, 50, 88, 121, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [63, 67, 97, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4075', '1.800', '0.1531', '1.800', '0.0913', '7.000', '0.7081', 1, 1, 1, 1, 1726229909.3059967]
VI_after__Init : ['1.202', '0.4076', '1.800', '0.1531', '1.800', '0.0855', '7.000', '0.7082', 1, 1, 1, 1, 1726229917.4114046]
VI_at__the_End : ['1.202', '0.4982', '1.800', '0.1414', '1.800', '0.1101', '7.000', '0.7090', 1, 1, 1, 1, 1726229985.2536364]