TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_26_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-012-07 | FUSED_ID : 6359364768400195783
  IC_TEMP :  -48.66 | VDDM : 1135.70 | AUX_INT :   -4.99 | CsaBias :   82.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.24857e-04 / 2
  ADC_P0  : -4.98964e-03 ± 1.82443e-02
  ADC_P1  : 7.99672e-03 ± 4.42298e-04
  ADC_P2  : -4.65736e-06 ± 2.11191e-06
  CSA_Chi2/NDF : 8.51879e-05 / 2
  CSA_P0  : 6.06216e-02 ± 6.15618e-03
  CSA_P1  : 9.63082e-03 ± 4.63824e-04
  CSA_P2  : -4.06738e-05 ± 7.06349e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [10, 43, 71, 77, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [36, 70, 80, 84, 90, 115, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4767', '1.800', '0.1482', '1.799', '0.0950', '7.000', '0.7077', 1, 1, 1, 1, 1726230395.4527133]
VI_after__Init : ['1.202', '0.4770', '1.800', '0.1481', '1.800', '0.0893', '7.000', '0.7076', 1, 1, 1, 1, 1726230403.676981]
VI_at__the_End : ['1.202', '0.5008', '1.800', '0.1387', '1.800', '0.1100', '7.000', '0.7084', 1, 1, 1, 1, 1726230465.2795339]