TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_33_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-016-00 | FUSED_ID : 6359364768400195840
  IC_TEMP :  -53.03 | VDDM : 1129.15 | AUX_INT :   -7.01 | CsaBias :   83.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.48753e-04 / 2
  ADC_P0  : -7.01248e-03 ± 1.96893e-02
  ADC_P1  : 8.31636e-03 ± 4.76913e-04
  ADC_P2  : -6.09525e-06 ± 2.28109e-06
  CSA_Chi2/NDF : 9.28596e-05 / 2
  CSA_P0  : 6.03246e-02 ± 6.42740e-03
  CSA_P1  : 9.59971e-03 ± 4.84259e-04
  CSA_P2  : -4.12521e-05 ± 7.37468e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [9, 15, 47, 53, 63, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [44, 53, 63, 107, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3648', '1.800', '0.1555', '1.799', '0.0969', '7.000', '0.7073', 1, 1, 1, 1, 1726230784.2876177]
VI_after__Init : ['1.202', '0.3651', '1.800', '0.1556', '1.800', '0.0911', '7.000', '0.7074', 1, 1, 1, 1, 1726230792.4760377]
VI_at__the_End : ['1.202', '0.4988', '1.800', '0.1401', '1.800', '0.1108', '7.000', '0.7080', 1, 1, 1, 1, 1726230859.214051]