TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_34_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-017-00 | FUSED_ID : 6359364768400195856
  IC_TEMP :  -52.48 | VDDM : 1126.92 | AUX_INT :   -6.38 | CsaBias :   77.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01460e-03 / 2
  ADC_P0  : -6.37515e-03 ± 2.15740e-02
  ADC_P1  : 8.46712e-03 ± 5.39959e-04
  ADC_P2  : -5.77923e-06 ± 2.67473e-06
  CSA_Chi2/NDF : 1.07559e-04 / 2
  CSA_P0  : 5.87803e-02 ± 6.91744e-03
  CSA_P1  : 9.88874e-03 ± 5.21180e-04
  CSA_P2  : -4.47520e-05 ± 7.93695e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [7, 24, 29, 35, 54, 72, 73, 84, 103, 106, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [3, 59, 90, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4505', '1.800', '0.1562', '1.800', '0.1003', '7.000', '0.7073', 1, 1, 1, 1, 1726230881.4303427]
VI_after__Init : ['1.202', '0.4508', '1.800', '0.1563', '1.799', '0.0946', '7.000', '0.7072', 1, 1, 1, 1, 1726230890.353642]
VI_at__the_End : ['1.202', '0.4983', '1.800', '0.1418', '1.800', '0.1123', '7.000', '0.7080', 1, 1, 1, 1, 1726230956.2986546]