TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_36_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-018-00 | FUSED_ID : 6359364768400195872
  IC_TEMP :  -50.42 | VDDM : 1132.31 | AUX_INT :   -5.26 | CsaBias :   86.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.17697e-04 / 2
  ADC_P0  : -5.25741e-03 ± 2.05166e-02
  ADC_P1  : 7.67628e-03 ± 4.68859e-04
  ADC_P2  : -4.73887e-06 ± 2.11163e-06
  CSA_Chi2/NDF : 9.45304e-05 / 2
  CSA_P0  : 5.81465e-02 ± 6.48497e-03
  CSA_P1  : 9.53120e-03 ± 4.88596e-04
  CSA_P2  : -3.98773e-05 ± 7.44073e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [9, 21, 50, 59, 66, 78, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [14, 105, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2094', '1.800', '0.1780', '1.799', '0.0919', '7.000', '0.7072', 1, 1, 1, 1, 1726230978.4510434]
VI_after__Init : ['1.202', '0.2094', '1.800', '0.1780', '1.800', '0.0871', '7.000', '0.7072', 1, 1, 1, 1, 1726230986.7513433]
VI_at__the_End : ['1.202', '0.4977', '1.800', '0.1386', '1.799', '0.1107', '7.000', '0.7078', 1, 1, 1, 1, 1726231054.2583723]