TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_37_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-019-00 | FUSED_ID : 6359364768400195888
  IC_TEMP :  -51.74 | VDDM : 1130.52 | AUX_INT :   -6.53 | CsaBias :   82.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02532e-03 / 2
  ADC_P0  : -6.53233e-03 ± 2.16664e-02
  ADC_P1  : 8.18784e-03 ± 5.18769e-04
  ADC_P2  : -5.76311e-06 ± 2.45502e-06
  CSA_Chi2/NDF : 9.23092e-05 / 2
  CSA_P0  : 5.84566e-02 ± 6.40833e-03
  CSA_P1  : 9.67290e-03 ± 4.82821e-04
  CSA_P2  : -4.12384e-05 ± 7.35280e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [40, 51, 84, 95, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [3, 8, 15, 40, 48, 60, 64, 105, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3180', '1.800', '0.1515', '1.799', '0.0868', '7.000', '0.7069', 1, 1, 1, 1, 1726231076.515579]
VI_after__Init : ['1.202', '0.3180', '1.800', '0.1515', '1.799', '0.0810', '7.000', '0.7072', 1, 1, 1, 1, 1726231084.6729858]
VI_at__the_End : ['1.202', '0.5009', '1.800', '0.1366', '1.800', '0.1104', '7.000', '0.7077', 1, 1, 1, 1, 1726231151.240935]