TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_47_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-025-00 | FUSED_ID : 6359364768400195984
  IC_TEMP :  -49.64 | VDDM : 1121.55 | AUX_INT :  -11.55 | CsaBias :   77.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.12632e-03 / 2
  ADC_P0  : -1.15511e-02 ± 3.12988e-02
  ADC_P1  : 8.17606e-03 ± 7.36604e-04
  ADC_P2  : -5.58542e-06 ± 3.46873e-06
  CSA_Chi2/NDF : 1.21724e-04 / 2
  CSA_P0  : 5.94528e-02 ± 7.35887e-03
  CSA_P1  : 9.81957e-03 ± 5.54437e-04
  CSA_P2  : -4.35160e-05 ± 8.44343e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [11, 17, 27, 51, 60, 79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [6, 19, 39, 44, 65, 68, 76, 80, 90, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2099', '1.800', '0.1623', '1.800', '0.0802', '7.000', '0.7072', 1, 1, 1, 1, 1726231660.4453282]
VI_after__Init : ['1.202', '0.2100', '1.800', '0.1622', '1.800', '0.0751', '7.000', '0.7069', 1, 1, 1, 1, 1726231668.4677608]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1364', '1.800', '0.1111', '7.000', '0.7080', 1, 1, 1, 1, 1726231735.4496422]