TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_50_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-027-00 | FUSED_ID : 6359364768400196016
  IC_TEMP :  -50.12 | VDDM : 1126.65 | AUX_INT :   -6.39 | CsaBias :   82.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.58775e-04 / 2
  ADC_P0  : -6.38689e-03 ± 1.98053e-02
  ADC_P1  : 8.14480e-03 ± 4.71628e-04
  ADC_P2  : -5.65200e-06 ± 2.22391e-06
  CSA_Chi2/NDF : 8.00247e-05 / 2
  CSA_P0  : 5.79924e-02 ± 5.96670e-03
  CSA_P1  : 9.50207e-03 ± 4.49548e-04
  CSA_P2  : -3.68848e-05 ± 6.84608e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [9, 60, 66, 75, 91, 107, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 51, 61, 84, 89, 104, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2021', '1.800', '0.1506', '1.799', '0.0901', '7.000', '0.7081', 1, 1, 1, 1, 1726231855.0955687]
VI_after__Init : ['1.202', '0.2024', '1.800', '0.1495', '1.800', '0.0815', '7.000', '0.7074', 1, 1, 1, 1, 1726231863.197856]
VI_at__the_End : ['1.202', '0.5057', '1.800', '0.1376', '1.800', '0.1103', '7.000', '0.7082', 1, 1, 1, 1, 1726231923.2533548]