TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_02_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-013-020-13 | FUSED_ID : 6359364768400200013
  IC_TEMP :  -52.08 | VDDM : 1135.56 | AUX_INT :   -4.07 | CsaBias :   75.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.36918e-04 / 2
  ADC_P0  : -4.07124e-03 ± 1.83955e-02
  ADC_P1  : 7.98052e-03 ± 4.45963e-04
  ADC_P2  : -4.59696e-06 ± 2.12940e-06
  CSA_Chi2/NDF : 1.11439e-04 / 2
  CSA_P0  : 6.02753e-02 ± 7.04109e-03
  CSA_P1  : 9.84709e-03 ± 5.30496e-04
  CSA_P2  : -4.42027e-05 ± 8.07882e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 5, 54, 57, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [5, 30, 104, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2767', '1.800', '0.1688', '1.800', '0.0953', '7.000', '0.7087', 1, 1, 1, 1, 1726232527.9991078]
VI_after__Init : ['1.202', '0.2765', '1.800', '0.1689', '1.799', '0.0871', '7.000', '0.7078', 1, 1, 1, 1, 1726232536.9493978]
VI_at__the_End : ['1.202', '0.5040', '1.800', '0.1386', '1.801', '0.1108', '7.000', '0.7087', 1, 1, 1, 1, 1726232602.386426]