TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_34_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-014-005-04 | FUSED_ID : 6359364768400203860
  IC_TEMP :  -52.82 | VDDM : 1127.97 | AUX_INT :   -7.63 | CsaBias :   83.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22196e-03 / 2
  ADC_P0  : -7.63440e-03 ± 2.37007e-02
  ADC_P1  : 8.36734e-03 ± 5.86804e-04
  ADC_P2  : -5.31074e-06 ± 2.89402e-06
  CSA_Chi2/NDF : 1.40712e-04 / 2
  CSA_P0  : 5.97345e-02 ± 7.91202e-03
  CSA_P1  : 1.00525e-02 ± 5.96114e-04
  CSA_P2  : -4.55466e-05 ± 9.07811e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [1, 6, 39, 41, 43, 50, 81, 89, 94, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [9, 56, 78, 84, 90, 94, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3423', '1.800', '0.1658', '1.799', '0.0927', '7.000', '0.7078', 1, 1, 1, 1, 1726234473.0639286]
VI_after__Init : ['1.202', '0.3423', '1.800', '0.1658', '1.799', '0.0873', '7.000', '0.7076', 1, 1, 1, 1, 1726234481.2293575]
VI_at__the_End : ['1.202', '0.5055', '1.800', '0.1399', '1.800', '0.1118', '7.000', '0.7082', 1, 1, 1, 1, 1726234543.7374034]