TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_36_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-014-006-04 | FUSED_ID : 6359364768400203876
  IC_TEMP :  -55.51 | VDDM : 1128.67 | AUX_INT :   -6.95 | CsaBias :   76.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08929e-03 / 2
  ADC_P0  : -6.95044e-03 ± 2.23224e-02
  ADC_P1  : 8.37811e-03 ± 5.42529e-04
  ADC_P2  : -6.24666e-06 ± 2.60678e-06
  CSA_Chi2/NDF : 1.68073e-04 / 2
  CSA_P0  : 5.82871e-02 ± 8.64712e-03
  CSA_P1  : 1.02178e-02 ± 6.51498e-04
  CSA_P2  : -4.83606e-05 ± 9.92154e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [19, 29, 41, 42, 44, 48, 77, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [62, 67, 81, 83, 99, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2944', '1.800', '0.1700', '1.800', '0.0895', '7.000', '0.7078', 1, 1, 1, 1, 1726234570.0962808]
VI_after__Init : ['1.202', '0.2946', '1.800', '0.1688', '1.799', '0.0840', '7.000', '0.7079', 1, 1, 1, 1, 1726234578.1347027]
VI_at__the_End : ['1.202', '0.5078', '1.800', '0.1398', '1.800', '0.1117', '7.000', '0.7085', 1, 1, 1, 1, 1726234638.457948]