TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_37_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-014-007-04 | FUSED_ID : 6359364768400203892
  IC_TEMP :  -50.60 | VDDM : 1135.80 | AUX_INT :  -51.60 | CsaBias :   52.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45039e-03 / 2
  ADC_P0  : -5.15982e-02 ± 2.82209e-02
  ADC_P1  : 8.74231e-03 ± 6.65772e-04
  ADC_P2  : -7.24867e-06 ± 3.09976e-06
  CSA_Chi2/NDF : 8.03908e-05 / 2
  CSA_P0  : 5.74193e-02 ± 5.98034e-03
  CSA_P1  : 9.25068e-03 ± 4.50575e-04
  CSA_P2  : -3.69727e-05 ± 6.86173e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 6, 16, 26, 39, 86, 100, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 50, 106, 107, 109, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1523', '1.800', '0.1443', '1.799', '0.0804', '7.000', '0.7086', 1, 1, 1, 1, 1726234667.5556622]
VI_after__Init : ['1.202', '0.1523', '1.800', '0.1443', '1.800', '0.0731', '7.000', '0.7077', 1, 1, 1, 1, 1726234676.3249753]
VI_at__the_End : ['1.202', '0.4916', '1.800', '0.1359', '1.800', '0.1103', '7.000', '0.7087', 1, 1, 1, 1, 1726234738.8810527]