TEST_NAME : Wafer
TEST_DATE : 24_09_16-08_16_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-014-013-04 | FUSED_ID : 6359364768400203988
  IC_TEMP :  -76.10 | VDDM : 1115.85 | AUX_INT :   -9.67 | CsaBias :   61.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34542e-03 / 2
  ADC_P0  : -9.66795e-03 ± 2.47902e-02
  ADC_P1  : 8.97929e-03 ± 6.35153e-04
  ADC_P2  : -7.41612e-06 ± 3.23568e-06
  CSA_Chi2/NDF : 2.18883e-04 / 2
  CSA_P0  : 5.70936e-02 ± 9.86798e-03
  CSA_P1  : 1.02602e-02 ± 7.43481e-04
  CSA_P2  : -6.13851e-05 ± 1.13223e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [51, 60, 62, 78, 97, 103, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [85, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3695', '1.800', '0.1669', '1.800', '0.1026', '7.000', '0.7078', 1, 1, 1, 1, 1726467412.3405876]
VI_after__Init : ['1.201', '0.3717', '1.800', '0.1676', '1.800', '0.0963', '7.000', '0.7077', 1, 1, 1, 1, 1726467420.3049152]
VI_at__the_End : ['1.201', '0.4560', '1.800', '0.1358', '1.803', '0.1201', '7.000', '0.7086', 1, 1, 1, 1, 1726467481.8213415]