TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_05_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-015-009-09 | FUSED_ID : 6359364768400208025
  IC_TEMP :  -55.72 | VDDM : 1140.14 | AUX_INT :   -7.54 | CsaBias :   83.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03354e-03 / 2
  ADC_P0  : -7.54445e-03 ± 2.17669e-02
  ADC_P1  : 8.32387e-03 ± 5.33580e-04
  ADC_P2  : -5.65827e-06 ± 2.58998e-06
  CSA_Chi2/NDF : 1.66171e-04 / 2
  CSA_P0  : 5.84291e-02 ± 8.59806e-03
  CSA_P1  : 1.03253e-02 ± 6.47802e-04
  CSA_P2  : -4.97109e-05 ± 9.86525e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [66, 68, 93, 106, 108, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [33, 70, 76, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3125', '1.800', '0.1970', '1.800', '0.0906', '7.000', '0.7079', 1, 1, 1, 1, 1726470318.0508795]
VI_after__Init : ['1.202', '0.3126', '1.800', '0.1971', '1.801', '0.0849', '7.000', '0.7079', 1, 1, 1, 1, 1726470326.1862867]
VI_at__the_End : ['1.202', '0.5066', '1.800', '0.1401', '1.799', '0.1118', '7.000', '0.7089', 1, 1, 1, 1, 1726470386.2325733]