TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_03_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-015-010-09 | FUSED_ID : 6359364768400208041
  IC_TEMP :  -48.08 | VDDM : 1126.50 | AUX_INT :   -5.51 | CsaBias :   87.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.84716e-04 / 2
  ADC_P0  : -5.51141e-03 ± 2.01628e-02
  ADC_P1  : 7.76723e-03 ± 4.72735e-04
  ADC_P2  : -4.32583e-06 ± 2.19273e-06
  CSA_Chi2/NDF : 9.73117e-05 / 2
  CSA_P0  : 5.80762e-02 ± 6.57968e-03
  CSA_P1  : 9.47259e-03 ± 4.95731e-04
  CSA_P2  : -3.91000e-05 ± 7.54940e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [4, 12, 16, 39, 71, 93, 94, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 12, 15, 25, 56, 74, 109, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3495', '1.800', '0.1555', '1.799', '0.0964', '7.000', '0.7081', 1, 1, 1, 1, 1726470220.6635747]
VI_after__Init : ['1.202', '0.3500', '1.800', '0.1554', '1.800', '0.0907', '7.000', '0.7079', 1, 1, 1, 1, 1726470228.868989]
VI_at__the_End : ['1.201', '0.4983', '1.800', '0.1366', '1.799', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1726470296.4006093]