TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_00_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-015-012-09 | FUSED_ID : 6359364768400208073
  IC_TEMP :  -50.84 | VDDM : 1130.45 | AUX_INT :   -7.50 | CsaBias :   73.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16556e-03 / 2
  ADC_P0  : -7.49782e-03 ± 2.31592e-02
  ADC_P1  : 8.16832e-03 ± 5.64087e-04
  ADC_P2  : -5.05894e-06 ± 2.72106e-06
  CSA_Chi2/NDF : 1.10327e-04 / 2
  CSA_P0  : 5.97884e-02 ± 7.00588e-03
  CSA_P1  : 9.67162e-03 ± 5.27843e-04
  CSA_P2  : -4.15768e-05 ± 8.03842e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [31, 86, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [35, 69, 91, 97, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3016', '1.800', '0.1346', '1.800', '0.0903', '7.000', '0.7081', 1, 1, 1, 1, 1726470027.1710186]
VI_after__Init : ['1.201', '0.3016', '1.800', '0.1347', '1.800', '0.0848', '7.000', '0.7080', 1, 1, 1, 1, 1726470035.2074516]
VI_at__the_End : ['1.201', '0.4991', '1.800', '0.1390', '1.803', '0.1117', '7.000', '0.7088', 1, 1, 1, 1, 1726470100.0142014]