TEST_NAME : Wafer
TEST_DATE : 24_09_16-08_52_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-015-017-14 | FUSED_ID : 6359364768400208158
  IC_TEMP :  -55.88 | VDDM : 1128.08 | AUX_INT :   -6.87 | CsaBias :   81.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43873e-03 / 2
  ADC_P0  : -6.86691e-03 ± 2.57511e-02
  ADC_P1  : 8.05813e-03 ± 6.17956e-04
  ADC_P2  : -5.01801e-06 ± 2.93291e-06
  CSA_Chi2/NDF : 1.08487e-04 / 2
  CSA_P0  : 5.96479e-02 ± 6.94722e-03
  CSA_P1  : 9.62046e-03 ± 5.23423e-04
  CSA_P2  : -4.27502e-05 ± 7.97111e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [2, 15, 18, 35, 63, 71, 73, 81, 102, 109, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [13, 36, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3147', '1.800', '0.1397', '1.800', '0.0905', '7.000', '0.7082', 1, 1, 1, 1, 1726469541.7386832]
VI_after__Init : ['1.202', '0.3148', '1.800', '0.1397', '1.800', '0.0846', '7.000', '0.7080', 1, 1, 1, 1, 1726469549.919966]
VI_at__the_End : ['1.202', '0.4919', '1.800', '0.1380', '1.799', '0.1114', '7.000', '0.7090', 1, 1, 1, 1, 1726469608.7089992]