TEST_NAME : Wafer
TEST_DATE : 24_09_16-08_50_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-015-018-14 | FUSED_ID : 6359364768400208174
  IC_TEMP :  -45.46 | VDDM : 1117.66 | AUX_INT :   -5.67 | CsaBias :  100.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17193e-03 / 2
  ADC_P0  : -5.66935e-03 ± 2.32502e-02
  ADC_P1  : 7.63481e-03 ± 5.40995e-04
  ADC_P2  : -4.08443e-06 ± 2.47837e-06
  CSA_Chi2/NDF : 9.99757e-05 / 2
  CSA_P0  : 6.00661e-02 ± 6.66914e-03
  CSA_P1  : 9.57342e-03 ± 5.02471e-04
  CSA_P2  : -4.04745e-05 ± 7.65204e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [40, 91, 106, 112, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [19, 45, 58, 66, 76]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3256', '1.800', '0.1562', '1.800', '0.0886', '7.000', '0.7082', 1, 1, 1, 1, 1726469444.9414365]
VI_after__Init : ['1.201', '0.3262', '1.800', '0.1564', '1.800', '0.0836', '7.000', '0.7080', 1, 1, 1, 1, 1726469452.977758]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1374', '1.799', '0.1090', '7.000', '0.7088', 1, 1, 1, 1, 1726469520.882362]