TEST_NAME : Wafer
TEST_DATE : 24_09_16-08_45_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-015-021-14 | FUSED_ID : 6359364768400208222
  IC_TEMP :  -53.90 | VDDM : 1123.84 | AUX_INT :   -8.50 | CsaBias :   80.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28429e-03 / 2
  ADC_P0  : -8.50271e-03 ± 2.42588e-02
  ADC_P1  : 8.12649e-03 ± 5.71277e-04
  ADC_P2  : -5.82220e-06 ± 2.66326e-06
  CSA_Chi2/NDF : 8.46318e-05 / 2
  CSA_P0  : 6.09332e-02 ± 6.13605e-03
  CSA_P1  : 9.36996e-03 ± 4.62307e-04
  CSA_P2  : -3.77981e-05 ± 7.04039e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [31, 32, 43, 89, 123, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [8, 20, 24, 33, 40, 68, 80, 82, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3611', '1.800', '0.1474', '1.800', '0.0885', '7.000', '0.7082', 1, 1, 1, 1, 1726469153.9237742]
VI_after__Init : ['1.202', '0.3613', '1.800', '0.1474', '1.800', '0.0832', '7.000', '0.7081', 1, 1, 1, 1, 1726469162.1070669]
VI_at__the_End : ['1.202', '0.4980', '1.800', '0.1384', '1.800', '0.1103', '7.000', '0.7087', 1, 1, 1, 1, 1726469229.6879299]