TEST_NAME : Wafer
TEST_DATE : 24_09_16-08_42_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-015-023-14 | FUSED_ID : 6359364768400208254
  IC_TEMP :  -51.55 | VDDM : 1132.65 | AUX_INT :   -8.21 | CsaBias :   79.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17276e-03 / 2
  ADC_P0  : -8.21277e-03 ± 2.32123e-02
  ADC_P1  : 8.05596e-03 ± 5.52925e-04
  ADC_P2  : -5.02768e-06 ± 2.61745e-06
  CSA_Chi2/NDF : 1.03979e-04 / 2
  CSA_P0  : 6.01106e-02 ± 6.80135e-03
  CSA_P1  : 9.58790e-03 ± 5.12433e-04
  CSA_P2  : -4.02528e-05 ± 7.80374e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [14, 17, 28, 51, 55, 56, 85, 92, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [4, 43, 75, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2538', '1.800', '0.1635', '1.800', '0.0866', '7.000', '0.7090', 1, 1, 1, 1, 1726468959.2086732]
VI_after__Init : ['1.201', '0.2539', '1.800', '0.1635', '1.800', '0.0793', '7.000', '0.7079', 1, 1, 1, 1, 1726468967.332987]
VI_at__the_End : ['1.201', '0.5032', '1.800', '0.1375', '1.800', '0.1098', '7.000', '0.7090', 1, 1, 1, 1, 1726469035.5088928]