TEST_NAME : Wafer
TEST_DATE : 24_09_16-10_03_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-017-010-12 | FUSED_ID : 6359364768400216236
  IC_TEMP :  -51.53 | VDDM : 1101.09 | AUX_INT :   -8.35 | CsaBias :   86.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17002e-03 / 2
  ADC_P0  : -8.34591e-03 ± 2.31774e-02
  ADC_P1  : 7.92178e-03 ± 5.41267e-04
  ADC_P2  : -4.92987e-06 ± 2.51295e-06
  CSA_Chi2/NDF : 1.22427e-04 / 2
  CSA_P0  : 5.86575e-02 ± 7.38009e-03
  CSA_P1  : 9.76709e-03 ± 5.56037e-04
  CSA_P2  : -4.27056e-05 ± 8.46778e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 27, 29, 37, 42, 58, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [56, 68, 72, 91, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2981', '1.800', '0.1510', '1.800', '0.0842', '7.000', '0.7080', 1, 1, 1, 1, 1726473818.6507592]
VI_after__Init : ['1.202', '0.2981', '1.800', '0.1511', '1.800', '0.0790', '7.000', '0.7079', 1, 1, 1, 1, 1726473826.7570314]
VI_at__the_End : ['1.202', '0.5025', '1.800', '0.1370', '1.800', '0.1107', '7.000', '0.7088', 1, 1, 1, 1, 1726473894.0609295]