TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_57_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-017-014-12 | FUSED_ID : 6359364768400216300
  IC_TEMP :  -49.58 | VDDM : 1129.44 | AUX_INT :   -6.07 | CsaBias :   74.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.22089e-04 / 2
  ADC_P0  : -6.07238e-03 ± 1.81880e-02
  ADC_P1  : 8.06536e-03 ± 4.37734e-04
  ADC_P2  : -5.04135e-06 ± 2.08287e-06
  CSA_Chi2/NDF : 1.06687e-04 / 2
  CSA_P0  : 5.91907e-02 ± 6.88934e-03
  CSA_P1  : 9.83276e-03 ± 5.19062e-04
  CSA_P2  : -4.25345e-05 ± 7.90470e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [11, 12, 65, 74, 115, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [66, 72, 74, 77, 81, 91, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1719', '1.800', '0.1202', '1.800', '0.0793', '7.000', '0.7082', 1, 1, 1, 1, 1726473429.2908087]
VI_after__Init : ['1.202', '0.1720', '1.800', '0.1203', '1.800', '0.0740', '7.000', '0.7079', 1, 1, 1, 1, 1726473437.2890964]
VI_at__the_End : ['1.202', '0.5062', '1.800', '0.1405', '1.799', '0.1100', '7.000', '0.7088', 1, 1, 1, 1, 1726473497.5995603]