TEST_NAME : Wafer
TEST_DATE : 24_09_16-10_10_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-018-009-02 | FUSED_ID : 6359364768400220306
  IC_TEMP :  -51.92 | VDDM : 1130.12 | AUX_INT :   -6.35 | CsaBias :   85.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.71443e-04 / 2
  ADC_P0  : -6.35333e-03 ± 2.11427e-02
  ADC_P1  : 8.37936e-03 ± 5.35008e-04
  ADC_P2  : -5.04707e-06 ± 2.67524e-06
  CSA_Chi2/NDF : 1.89848e-04 / 2
  CSA_P0  : 5.79088e-02 ± 9.19021e-03
  CSA_P1  : 1.01106e-02 ± 6.92416e-04
  CSA_P2  : -4.60925e-05 ± 1.05447e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [39, 47, 54, 59, 60, 89, 94, 104, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [20, 25, 79, 83, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4466', '1.800', '0.1626', '1.800', '0.0976', '7.000', '0.7083', 1, 1, 1, 1, 1726474206.944756]
VI_after__Init : ['1.202', '0.4469', '1.800', '0.1626', '1.800', '0.0922', '7.000', '0.7078', 1, 1, 1, 1, 1726474215.2431023]
VI_at__the_End : ['1.202', '0.5119', '1.800', '0.1432', '1.800', '0.1127', '7.000', '0.7087', 1, 1, 1, 1, 1726474274.7415683]