TEST_NAME : Wafer
TEST_DATE : 24_09_16-10_16_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-018-013-02 | FUSED_ID : 6359364768400220370
  IC_TEMP :  -44.81 | VDDM : 1131.01 | AUX_INT :   -5.91 | CsaBias :   80.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.35255e-04 / 2
  ADC_P0  : -5.90525e-03 ± 2.07228e-02
  ADC_P1  : 7.94141e-03 ± 4.93021e-04
  ADC_P2  : -4.72008e-06 ± 2.32122e-06
  CSA_Chi2/NDF : 8.17076e-05 / 2
  CSA_P0  : 5.90144e-02 ± 6.02911e-03
  CSA_P1  : 9.49577e-03 ± 4.54250e-04
  CSA_P2  : -3.70052e-05 ± 6.91769e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [8, 69, 72]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [10, 16, 42, 64]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2762', '1.800', '0.1712', '1.800', '0.0828', '7.000', '0.7079', 1, 1, 1, 1, 1726474595.4348836]
VI_after__Init : ['1.202', '0.2764', '1.800', '0.1712', '1.800', '0.0770', '7.000', '0.7081', 1, 1, 1, 1, 1726474604.4232097]
VI_at__the_End : ['1.202', '0.5055', '1.800', '0.1359', '1.802', '0.1093', '7.000', '0.7090', 1, 1, 1, 1, 1726474668.2543466]