TEST_NAME : Wafer
TEST_DATE : 24_09_16-10_23_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-018-017-05 | FUSED_ID : 6359364768400220437
  IC_TEMP :  -49.31 | VDDM : 1120.13 | AUX_INT :   -8.65 | CsaBias :   87.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36936e-03 / 2
  ADC_P0  : -8.65033e-03 ± 2.51266e-02
  ADC_P1  : 7.44335e-03 ± 5.55425e-04
  ADC_P2  : -4.09708e-06 ± 2.44480e-06
  CSA_Chi2/NDF : 1.03492e-04 / 2
  CSA_P0  : 5.66165e-02 ± 6.78541e-03
  CSA_P1  : 9.55503e-03 ± 5.11232e-04
  CSA_P2  : -3.94324e-05 ± 7.78546e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [21, 75, 80, 89, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 35, 36, 44, 53, 56, 88, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2599', '1.800', '0.1370', '1.800', '0.0914', '7.000', '0.7090', 1, 1, 1, 1, 1726474985.222074]
VI_after__Init : ['1.202', '0.2597', '1.800', '0.1369', '1.800', '0.0841', '7.000', '0.7079', 1, 1, 1, 1, 1726474993.2434416]
VI_at__the_End : ['1.202', '0.4989', '1.800', '0.1338', '1.799', '0.1108', '7.000', '0.7090', 1, 1, 1, 1, 1726475060.0872884]