TEST_NAME : Wafer
TEST_DATE : 24_09_17-11_04_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-028-007-012-07 | FUSED_ID : 6359364768402272455
  IC_TEMP :  -55.54 | VDDM : 1129.24 | AUX_INT :   -7.23 | CsaBias :   81.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.75632e-04 / 2
  ADC_P0  : -7.23035e-03 ± 2.11571e-02
  ADC_P1  : 8.13915e-03 ± 5.10877e-04
  ADC_P2  : -5.20707e-06 ± 2.44198e-06
  CSA_Chi2/NDF : 1.26128e-04 / 2
  CSA_P0  : 5.94079e-02 ± 7.49081e-03
  CSA_P1  : 9.79606e-03 ± 5.64379e-04
  CSA_P2  : -4.55068e-05 ± 8.59482e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [5, 43, 59, 88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [36, 60, 80, 85, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2751', '1.800', '0.1248', '1.799', '0.0875', '7.000', '0.7078', 1, 1, 1, 1, 1726563861.4103162]
VI_after__Init : ['1.202', '0.2731', '1.800', '0.1247', '1.800', '0.0824', '7.000', '0.7079', 1, 1, 1, 1, 1726563870.1645834]
VI_at__the_End : ['1.201', '0.4920', '1.800', '0.1371', '1.802', '0.1132', '7.000', '0.7084', 1, 1, 1, 1, 1726563933.0054877]