TEST_NAME : Wafer
TEST_DATE : 24_09_17-11_02_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-028-007-013-07 | FUSED_ID : 6359364768402272471
  IC_TEMP :  -61.15 | VDDM : 1116.28 | AUX_INT :   -8.25 | CsaBias :   75.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32124e-03 / 2
  ADC_P0  : -8.25039e-03 ± 2.46218e-02
  ADC_P1  : 8.41645e-03 ± 6.03692e-04
  ADC_P2  : -6.13047e-06 ± 2.92750e-06
  CSA_Chi2/NDF : 1.31168e-04 / 2
  CSA_P0  : 5.83278e-02 ± 7.63899e-03
  CSA_P1  : 9.80792e-03 ± 5.75543e-04
  CSA_P2  : -4.68156e-05 ± 8.76484e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [32, 43, 55, 58, 68, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 29, 30, 80]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1291', '1.800', '0.1755', '1.800', '0.0811', '7.000', '0.7077', 1, 1, 1, 1, 1726563764.8391192]
VI_after__Init : ['1.202', '0.1291', '1.800', '0.1753', '1.800', '0.0754', '7.000', '0.7078', 1, 1, 1, 1, 1726563772.9013767]
VI_at__the_End : ['1.201', '0.4868', '1.800', '0.1394', '1.804', '0.1135', '7.000', '0.7087', 1, 1, 1, 1, 1726563838.5481076]