TEST_NAME : Wafer
TEST_DATE : 24_09_17-12_48_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-028-010-004-00 | FUSED_ID : 6359364768402284608
  IC_TEMP :  -58.56 | VDDM : 1129.76 | AUX_INT :   -7.41 | CsaBias :   75.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06790e-03 / 2
  ADC_P0  : -7.41417e-03 ± 2.21190e-02
  ADC_P1  : 8.33814e-03 ± 5.40463e-04
  ADC_P2  : -5.91896e-06 ± 2.60884e-06
  CSA_Chi2/NDF : 1.22120e-04 / 2
  CSA_P0  : 5.78525e-02 ± 7.37081e-03
  CSA_P1  : 9.89633e-03 ± 5.55338e-04
  CSA_P2  : -4.52111e-05 ± 8.45713e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [27, 96, 107, 117, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [17, 57, 89, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1920', '1.800', '0.1458', '1.800', '0.0827', '7.000', '0.7083', 1, 1, 1, 1, 1726570094.4531593]
VI_after__Init : ['1.201', '0.1920', '1.800', '0.1455', '1.799', '0.0753', '7.000', '0.7075', 1, 1, 1, 1, 1726570102.4675684]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1384', '1.803', '0.1142', '7.000', '0.7083', 1, 1, 1, 1, 1726570161.3099918]