TEST_NAME : Wafer
TEST_DATE : 24_09_17-15_28_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-028-013-003-08 | FUSED_ID : 6359364768402296888
  IC_TEMP :  -56.20 | VDDM : 1128.59 | AUX_INT :   -5.16 | CsaBias :   75.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.68020e-04 / 2
  ADC_P0  : -5.15781e-03 ± 1.74754e-02
  ADC_P1  : 8.15889e-03 ± 4.25016e-04
  ADC_P2  : -5.44763e-06 ± 2.03091e-06
  CSA_Chi2/NDF : 1.10622e-04 / 2
  CSA_P0  : 5.78974e-02 ± 7.01524e-03
  CSA_P1  : 9.61795e-03 ± 5.28547e-04
  CSA_P2  : -4.03471e-05 ± 8.04915e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [80, 93, 117, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [58, 62, 100, 101, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4549', '1.800', '0.1318', '1.799', '0.1003', '7.000', '0.7079', 1, 1, 1, 1, 1726579738.1717653]
VI_after__Init : ['1.202', '0.4553', '1.800', '0.1319', '1.800', '0.0947', '7.000', '0.7079', 1, 1, 1, 1, 1726579746.1112418]
VI_at__the_End : ['1.202', '0.5000', '1.800', '0.1376', '1.799', '0.1126', '7.000', '0.7089', 1, 1, 1, 1, 1726579813.245915]