TEST_NAME : Wafer
TEST_DATE : 24_09_17-15_12_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-028-013-013-08 | FUSED_ID : 6359364768402297048
  IC_TEMP :  -53.66 | VDDM : 1128.94 | AUX_INT :   -7.87 | CsaBias :   80.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42591e-03 / 2
  ADC_P0  : -7.87298e-03 ± 2.56063e-02
  ADC_P1  : 8.13805e-03 ± 6.10054e-04
  ADC_P2  : -5.45375e-06 ± 2.88519e-06
  CSA_Chi2/NDF : 9.62938e-05 / 2
  CSA_P0  : 5.90974e-02 ± 6.54518e-03
  CSA_P1  : 9.52015e-03 ± 4.93132e-04
  CSA_P2  : -4.19555e-05 ± 7.50982e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [24, 45, 54, 66, 76, 99, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 45, 64, 83, 88, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3668', '1.800', '0.1592', '1.799', '0.0958', '7.000', '0.7080', 1, 1, 1, 1, 1726578765.4607286]
VI_after__Init : ['1.202', '0.3669', '1.800', '0.1592', '1.800', '0.0901', '7.000', '0.7078', 1, 1, 1, 1, 1726578773.5451407]
VI_at__the_End : ['1.202', '0.4883', '1.800', '0.1389', '1.799', '0.1123', '7.000', '0.7087', 1, 1, 1, 1, 1726578842.0374823]