TEST_NAME : Wafer
TEST_DATE : 24_09_17-15_09_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-028-013-015-08 | FUSED_ID : 6359364768402297080
  IC_TEMP :  -55.70 | VDDM : 1133.74 | AUX_INT :  -44.07 | CsaBias :   56.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28797e-03 / 2
  ADC_P0  : -4.40724e-02 ± 2.62016e-02
  ADC_P1  : 9.20193e-03 ± 6.57633e-04
  ADC_P2  : -8.09271e-06 ± 3.25040e-06
  CSA_Chi2/NDF : 1.29331e-04 / 2
  CSA_P0  : 6.03644e-02 ± 7.58533e-03
  CSA_P1  : 9.97024e-03 ± 5.71500e-04
  CSA_P2  : -4.57289e-05 ± 8.70326e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 30, 75, 81, 98, 100, 116, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 10, 24, 43, 76, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4039', '1.800', '0.1483', '1.800', '0.0973', '7.000', '0.7077', 1, 1, 1, 1, 1726578569.462143]
VI_after__Init : ['1.202', '0.4042', '1.800', '0.1485', '1.800', '0.0920', '7.000', '0.7079', 1, 1, 1, 1, 1726578578.2013059]
VI_at__the_End : ['1.202', '0.5030', '1.800', '0.1398', '1.800', '0.1127', '7.000', '0.7084', 1, 1, 1, 1, 1726578645.6927319]