TEST_NAME : Wafer
TEST_DATE : 24_09_17-15_07_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-028-013-016-15 | FUSED_ID : 6359364768402297103
  IC_TEMP :  -64.46 | VDDM : 1118.09 | AUX_INT :   -8.40 | CsaBias :   88.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23546e-03 / 2
  ADC_P0  : -8.39969e-03 ± 2.37931e-02
  ADC_P1  : 8.13694e-03 ± 5.60310e-04
  ADC_P2  : -5.87073e-06 ± 2.61213e-06
  CSA_Chi2/NDF : 1.00535e-04 / 2
  CSA_P0  : 5.83947e-02 ± 6.68778e-03
  CSA_P1  : 9.29057e-03 ± 5.03876e-04
  CSA_P2  : -4.41910e-05 ± 7.67343e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [4, 14, 64, 74, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [46, 89, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1446', '1.800', '0.1335', '1.800', '0.0790', '7.000', '0.7080', 1, 1, 1, 1, 1726578472.2592824]
VI_after__Init : ['1.202', '0.1444', '1.800', '0.1332', '1.800', '0.0739', '7.000', '0.7079', 1, 1, 1, 1, 1726578480.373591]
VI_at__the_End : ['1.202', '0.4657', '1.800', '0.1355', '1.799', '0.1143', '7.000', '0.7085', 1, 1, 1, 1, 1726578547.9248831]