TEST_NAME : Wafer
TEST_DATE : 24_09_17-16_56_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-028-016-013-03 | FUSED_ID : 6359364768402309331
  IC_TEMP :  -47.82 | VDDM : 1121.41 | AUX_INT :  -16.88 | CsaBias :   87.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27115e-03 / 2
  ADC_P0  : -1.68786e-02 ± 2.45629e-02
  ADC_P1  : 8.13054e-03 ± 5.75416e-04
  ADC_P2  : -5.60699e-06 ± 2.67283e-06
  CSA_Chi2/NDF : 8.84461e-05 / 2
  CSA_P0  : 5.83889e-02 ± 6.27280e-03
  CSA_P1  : 9.50612e-03 ± 4.72610e-04
  CSA_P2  : -3.81594e-05 ± 7.19730e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 17, 24, 27, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 12, 30, 42, 54, 79, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2796', '1.800', '0.1291', '1.800', '0.0894', '7.000', '0.7079', 1, 1, 1, 1, 1726584992.835311]
VI_after__Init : ['1.202', '0.2797', '1.800', '0.1291', '1.801', '0.0838', '7.000', '0.7083', 1, 1, 1, 1, 1726585000.8527365]
VI_at__the_End : ['1.202', '0.5021', '1.800', '0.1385', '1.803', '0.1089', '7.000', '0.7087', 1, 1, 1, 1, 1726585057.7243118]