TEST_NAME : Wafer
TEST_DATE : 24_09_17-17_01_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-028-016-016-04 | FUSED_ID : 6359364768402309380
  IC_TEMP :  -48.64 | VDDM : 1127.72 | AUX_INT :   -6.83 | CsaBias :   94.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27743e-03 / 2
  ADC_P0  : -6.82563e-03 ± 2.42246e-02
  ADC_P1  : 7.89322e-03 ± 5.64499e-04
  ADC_P2  : -5.25689e-06 ± 2.58830e-06
  CSA_Chi2/NDF : 7.96708e-05 / 2
  CSA_P0  : 5.93503e-02 ± 5.95350e-03
  CSA_P1  : 9.18979e-03 ± 4.48553e-04
  CSA_P2  : -3.36460e-05 ± 6.83093e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [17, 51, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [10, 26, 55, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4299', '1.800', '0.1528', '1.800', '0.0957', '7.000', '0.7080', 1, 1, 1, 1, 1726585277.8131053]
VI_after__Init : ['1.201', '0.4299', '1.800', '0.1528', '1.800', '0.0905', '7.000', '0.7080', 1, 1, 1, 1, 1726585285.875519]
VI_at__the_End : ['1.201', '0.5011', '1.800', '0.1363', '1.804', '0.1095', '7.000', '0.7088', 1, 1, 1, 1, 1726585344.4449995]