TEST_NAME : Wafer
TEST_DATE : 24_09_18-08_13_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-002-010-04 | FUSED_ID : 6359364768403300516
  IC_TEMP :  -78.78 | VDDM : 1088.72 | AUX_INT :  -10.88 | CsaBias :   53.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72773e-03 / 2
  ADC_P0  : -1.08801e-02 ± 2.80920e-02
  ADC_P1  : 9.31085e-03 ± 7.31655e-04
  ADC_P2  : -8.63456e-06 ± 3.78473e-06
  CSA_Chi2/NDF : 2.15705e-04 / 2
  CSA_P0  : 5.68044e-02 ± 9.79608e-03
  CSA_P1  : 9.89330e-03 ± 7.38064e-04
  CSA_P2  : -5.61706e-05 ± 1.12398e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [19, 30, 31, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3081', '1.800', '0.1415', '1.800', '0.0965', '7.000', '0.7076', 1, 1, 1, 1, 1726639987.9711828]
VI_after__Init : ['1.201', '0.3080', '1.800', '0.1415', '1.800', '0.0905', '7.000', '0.7074', 1, 1, 1, 1, 1726639996.1985912]
VI_at__the_End : ['1.201', '0.4513', '1.800', '0.1351', '1.804', '0.1216', '7.000', '0.7085', 1, 1, 1, 1, 1726640048.7006078]