TEST_NAME : Wafer
TEST_DATE : 24_09_18-08_34_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-003-019-14 | FUSED_ID : 6359364768403304766
  IC_TEMP :  -65.08 | VDDM : 1113.07 | AUX_INT :   -8.29 | CsaBias :   66.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40502e-03 / 2
  ADC_P0  : -8.28880e-03 ± 2.54635e-02
  ADC_P1  : 8.37259e-03 ± 6.37466e-04
  ADC_P2  : -5.06305e-06 ± 3.17063e-06
  CSA_Chi2/NDF : 1.72343e-04 / 2
  CSA_P0  : 5.70970e-02 ± 8.75627e-03
  CSA_P1  : 1.00250e-02 ± 6.59722e-04
  CSA_P2  : -5.25294e-05 ± 1.00468e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [61]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2109', '1.800', '0.1677', '1.800', '0.0882', '7.000', '0.7079', 1, 1, 1, 1, 1726641259.0456185]
VI_after__Init : ['1.202', '0.2110', '1.800', '0.1678', '1.799', '0.0826', '7.000', '0.7079', 1, 1, 1, 1, 1726641266.4800465]
VI_at__the_End : ['1.201', '0.4757', '1.800', '0.1359', '1.800', '0.1171', '7.000', '0.7086', 1, 1, 1, 1, 1726641326.0004127]