TEST_NAME : Wafer
TEST_DATE : 24_09_18-08_31_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-003-021-14 | FUSED_ID : 6359364768403304798
  IC_TEMP :  -67.47 | VDDM : 1123.45 | AUX_INT :   -8.59 | CsaBias :   72.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28653e-03 / 2
  ADC_P0  : -8.58565e-03 ± 2.42531e-02
  ADC_P1  : 9.13030e-03 ± 6.34493e-04
  ADC_P2  : -7.81330e-06 ± 3.27970e-06
  CSA_Chi2/NDF : 1.96117e-04 / 2
  CSA_P0  : 5.66194e-02 ± 9.34071e-03
  CSA_P1  : 1.02248e-02 ± 7.03755e-04
  CSA_P2  : -5.40367e-05 ± 1.07174e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [16]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3047', '1.800', '0.1520', '1.799', '0.0962', '7.000', '0.7086', 1, 1, 1, 1, 1726641063.5866044]
VI_after__Init : ['1.202', '0.3045', '1.800', '0.1521', '1.799', '0.0889', '7.000', '0.7079', 1, 1, 1, 1, 1726641071.6431127]
VI_at__the_End : ['1.202', '0.4808', '1.800', '0.1376', '1.801', '0.1182', '7.000', '0.7086', 1, 1, 1, 1, 1726641130.6435258]