TEST_NAME : Wafer
TEST_DATE : 24_09_18-09_13_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-004-017-06 | FUSED_ID : 6359364768403308822
  IC_TEMP :  -56.95 | VDDM : 1127.24 | AUX_INT :   -6.64 | CsaBias :   68.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.20368e-04 / 2
  ADC_P0  : -6.63531e-03 ± 1.93844e-02
  ADC_P1  : 8.39710e-03 ± 4.83488e-04
  ADC_P2  : -5.58610e-06 ± 2.38375e-06
  CSA_Chi2/NDF : 1.67166e-04 / 2
  CSA_P0  : 5.79829e-02 ± 8.62375e-03
  CSA_P1  : 1.04702e-02 ± 6.49737e-04
  CSA_P2  : -5.38558e-05 ± 9.89473e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [24]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [21]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4705', '1.800', '0.1573', '1.800', '0.0915', '7.000', '0.7078', 1, 1, 1, 1, 1726643594.4285944]
VI_after__Init : ['1.202', '0.4710', '1.799', '0.1575', '1.800', '0.0860', '7.000', '0.7081', 1, 1, 1, 1, 1726643602.419016]
VI_at__the_End : ['1.201', '0.4993', '1.800', '0.1386', '1.800', '0.1115', '7.000', '0.7086', 1, 1, 1, 1, 1726643660.1861532]